WMSIC Electronic Components

muRata GRT21BR61H475KE13L

ModelGRT21BR61H475KE13L
Package0805
BrandmuRata
Price Price on request Electronic component prices change quickly with market supply and demand. Please refer to the latest WMSIC quotation for current pricing.
Configuration
1 options
Configuration 26+

Available for RFQ

Technical data

Product details

18 specifications

Core information

Product name
mu Rata GRT21BR61H475KE13L
Type
MURATA
Minimum package
3000 圆盘

Technical parameters

Electronic Component
Electronic Component
Electronic Component
MURATA
Electronic Component
GRT21BR61H475KE13L
Electronic Component
1
Electronic Component
4.7uF
Package
0805
Electronic Component
SMD Capacitor(MLCC)
Electronic Component
±10%
Electronic Component
0.03g
Electronic Component
1
Electronic Component
BM0231020113
Electronic Component
X5R
Voltage
50V
Electronic Component
Electronic Component
Electronic Component
3000

For datasheets, package documents, compatible-part guidance, or other technical resources, contact WMSIC customer service. Availability is confirmed case by case.

GRT21BR61H475KE13L 产品概述

一、基本参数与型号说明

GRT21BR61H475KE13L 为 muRata(村田)系列贴片多层陶瓷电容(MLCC),关键参数如下:

  • 电容值:4.7 μF
  • 精度:±10%(K)
  • 额定电压:50 V DC
  • 温度特性:X5R(介质型)
  • 封装:0805(公制约 2012,约 2.0 × 1.25 mm)
    此型号适用于对体积和额定电压都有较高要求但允许温度/电压引起电容变化的电路场合。

二、介质与温度特性说明

X5R 属于 II 类陶瓷介质,标准温度范围为 −55°C 到 +85°C,介质在该温度范围内的容值变化通常在 ±15% 以内(相对于室温)。与 C0G/NP0 等一类介质相比,X5R 在体积与电容密度上有优势,但会出现随温度、偏压(DC bias)和老化引起的容值下降现象。设计时需把这些非线性特性考虑进整体容值裕度。

三、电气特性与设计注意事项

  • DC bias(直流偏压)效应:在施加接近或等于额定电压时,X5R 的实际有效电容会明显低于标称值。大型值、高压组合时此现象更明显。要获得准确的系统滤波能力,应参考厂方 DC-bias 曲线或在工作电压下进行实测。
  • 温度与老化:X5R 存在随温度变化和长期使用的老化效应,初始误差 ±10% 之外还需考虑这些变化。
  • ESR 与纹波电流:MLCC 本身 ESR 很低,适合高频去耦,但在高纹波电流或高温场合会发热。若纹波较大,可并联多个电容或选用更大封装以降低电流密度。
  • 布局与接地:贴片电容应尽量靠近被去耦的器件电源引脚,焊盘走线尽量短、宽,多走地线过孔以减小 ESL/ESR 并提升热散能力。

四、典型应用场景

  • 开关电源输入/输出滤波与去耦
  • DC-DC 降压/升压模块的旁路与稳定电路
  • 电源母线滤波(中高压轨)与储能补偿(取决于 DC-bias 实测结果)
  • 工业控制、通信电源等对 50 V 等级电压有需求的应用

五、封装与焊接建议

0805 封装适合高密度贴装。推荐遵循村田或行业的焊盘布局与回流焊曲线,避免超时高温或机械弯曲导致陶瓷开裂。贴装时注意避免基板挠曲、过长的焊膏停留及单边焊接引起的“墓碑现象”。

六、选型与替代建议

  • 若对温度稳定性与低偏置变化有严格要求,考虑换用 C0G/NP0 或降低工作电压并增大容量的组合。
  • 若在额定电压下实际容值不足,建议:提高标称电容、并联多个电容或采用更大封装(如 1210/1812)以获得更稳定的有效电容与更高的纹波承受能力。
  • 采购与可靠性:针对关键应用建议参考村田官方数据手册,查看 DC-bias、ESR、寿命及可靠性测试数据,必要时索取样品并在目标工况下进行验证。

总结:GRT21BR61H475KE13L 提供了在 0805 小型封装内较高的容量和 50 V 的耐压能力,适合中高压电源去耦与滤波应用,但在设计中必须考虑 X5R 的 DC-bias 与温度/老化效应,通过合理选型与 PCB 布局可获得稳定可靠的电路性能。

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