WMSIC Electronic Components

ST LMV331ICT

ModelLMV331ICT
PackageSC-70-5
BrandST
Price Price on request Electronic component prices change quickly with market supply and demand. Please refer to the latest WMSIC quotation for current pricing.
Configuration
1 options
Configuration 25+

Available for RFQ

Technical data

Product details

19 specifications

Core information

Product name
ST(STMicroelectronics) LMV331ICT
Type
ST
Minimum package
3000 圆盘

Technical parameters

Electronic Component
Electronic Component
Electronic Component
ST(STMicroelectronics)
Electronic Component
LMV331ICT
Electronic Component
1
Package
SC-70-5
Electronic Component
Comparator
Electronic Component
0.016g
Power Supply
2.7V~5V
Electronic Component
1
Electronic Component
BM0228744801
Operating Temperature
40℃~+85℃
Comparator
Electronic Component
Output Type
Electronic Component
Static Current(Iq)
100uA
(tpd)
550ns
Electronic Component
Electronic Component

For datasheets, package documents, compatible-part guidance, or other technical resources, contact WMSIC customer service. Availability is confirmed case by case.

LMV331ICT 产品概述

一、主要特性

LMV331ICT 是一款单路电压比较器,具备开漏输出结构,可在 2.7V 至 5V 单电源条件下工作。器件设计侧重低功耗与高速响应,典型静态电流仅约 20 μA,传播延迟约 200 ns,适合对速度与能耗有平衡要求的便携与嵌入式系统。

二、关键电气参数

  • 输入失调电压 Vos:约 1 mV(失调温漂 Vos TC ≈ 5 μV/℃)
  • 输入偏置电流 Ib:约 25 nA;输入失调电流 Ios:约 1 nA
  • 输出形式:开漏(需外接上拉电阻)
  • 静态电流 Iq:20 μA(典型)
  • 工作温度范围:-40 ℃ 至 +85 ℃
  • 单电源范围:2.7 V ~ 5 V
    (器件描述中亦常见 7 mV/250 nA 等标称值,可根据具体数据手册核实最大/典型值)

三、封装信息

该型号提供小封装 SC-70-5(适合空间受限的表贴电路),便于移动设备、传感器模块和高密度 PCB 布局使用。

四、典型应用场景

  • 电平检测与门限比较(电池电压监测、欠压/过压检测)
  • 脉冲整形与限幅电路(与数字逻辑配合做边沿检测)
  • 传感器信号放大前的阈值判断
  • 电平移位与开关驱动(利用开漏输出与外部上拉实现逻辑兼容)

五、设计与使用建议

  • 由于输出为开漏,必须配合合适阻值的上拉电阻,选择时兼顾响应速度与功耗;更高的上拉阻值可降低功耗但会增加上升时间。
  • 电源旁路:为获得稳定的比较性能和最小噪声,建议在靠近芯片电源引脚处放置 0.1 μF 陶瓷旁路电容。
  • 输入保护:避免将输入悬空或超过电源范围,必要时添加限流或钳位电路以防干扰或瞬态电压。
  • 布局注意:将输入引脚与高频、大电流回路隔离,减少输入失调与噪声耦合;敏感差分输入应尽量短线布局。

六、注意事项

在要求极低偏移或严格线性比较的场合,应以实际数据表中的最大值与典型值为准,并参考温度漂移与输入共模电压范围限制。选择上拉电平时,确保不超过器件允许的最大输出电压限制,以免损坏开漏结构。

总结:LMV331ICT 凭借低功耗、小封装与较快的响应,适用于对体积与能耗敏感且需可靠阈值检测的电子系统。具体设计前请参照 ST 官方数据手册完成尺寸和极限参数确认。

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