WMSIC Electronic Components

CL21B105KBFVPNE

ModelCL21B105KBFVPNE
Package0805
BrandSAMSUNG
Price Price on request Electronic component prices change quickly with market supply and demand. Please refer to the latest WMSIC quotation for current pricing.
Configuration
1 options
Configuration 26+

Available for RFQ

Technical data

Product details

18 specifications

Core information

Product name
SAMSUNG CL21B105KBFVPNE
Type
SAMSUNG
Minimum package
2000 圆盘

Technical parameters

Electronic Component
Electronic Component
Electronic Component
SAMSUNG
Electronic Component
CL21B105KBFVPNE
Electronic Component
1
Electronic Component
1uF
Package
0805
Electronic Component
SMD Capacitor(MLCC)
Electronic Component
±10%
Electronic Component
0.034g
Electronic Component
1
Electronic Component
BM0257686745
Electronic Component
X7R
Voltage
50V
Electronic Component
Electronic Component
Electronic Component
2000

For datasheets, package documents, compatible-part guidance, or other technical resources, contact WMSIC customer service. Availability is confirmed case by case.

CL21B105KBFVPNE 产品概述

一、产品简介

CL21B105KBFVPNE 为 SAMSUNG(三星)生产的多层陶瓷贴片电容(MLCC),标称容量 1µF,公差 ±10%(K),额定电压 50V,介质类型 X7R,封装 0805(约 2.0 × 1.25 mm)。此型号在有限体积内提供较高电容量,适合常见的去耦、滤波与旁路场合。

二、主要特性

  • 介质 X7R:工作温度范围宽(典型 -55℃ 至 +125℃),温度特性良好,适用于对温度稳定性有中等要求的电路。
  • 低等效串联电阻/电感(ESR/ESL):MLCC 本身在高频下表现优异,适合高频去耦与瞬态响应要求高的电源线。
  • 封装紧凑:0805 大小在布局与空间受限的移动设备、通信模块中有较好平衡。
  • 工艺可靠:适用于无铅回流焊流程,机械可靠性良好(注意焊接与封装机械应力控制)。

三、电气性能与使用注意

  • 直流偏压效应:陶瓷电容在施加直流偏压时实际容量会下降,X7R 在高电压下的降容较明显,设计时需留有裕量并参考制造商的 DC-bias 曲线。
  • 老化特性:铁电陶瓷存在随时间的容量衰减现象(可通过一定温度处理部分恢复),长期使用时应考虑老化影响。
  • 温度与频率特性:X7R 在温度和频率变化下容量波动小于高介电常数的一些材料,但不适合精密计时或高稳定度测量电路。

四、典型应用场景

  • 数字与模拟芯片的电源去耦与旁路。
  • 开关电源输入/输出滤波与能量缓冲(需按 DC-bias 考量实际容量)。
  • 滤波电路、耦合/旁路、EMI 抑制。
  • 移动终端、通信设备、消费类电子及工业控制模块等一般电子产品。

五、PCB 布局与焊接建议

  • 贴近被去耦器件的电源引脚布局,减短回流路径以提升高频性能。
  • 与不同容值并联使用,以覆盖更宽的频谱(例如与小容值低 ESL 电容并联)。
  • 避免在焊接与后处理过程中对封装施加过大机械应力,焊盘过大或不合理过孔位置可能引起裂纹。
  • 遵循厂商的回流焊曲线与推荐焊盘尺寸,确保良好焊接品质。

六、选型要点

在选用 CL21B105KBFVPNE 时,重点考虑直流偏压下的有效容量、工作温度范围、封装与安装应力、以及电路对容差与稳定性的实际要求。若电路对长期容量稳定性或高温高压下性能敏感,可选用更高电压等级、更大封装或不同介质的器件以获得更佳表现。

总结:CL21B105KBFVPNE 以其 1µF/50V、0805 的紧凑组合,在常规电子设计中提供了良好的去耦和滤波解决方案,但在高偏压或高可靠性场合应结合 DC-bias、老化与机械强度等因素进行周全评估。

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