WMSIC Electronic Components

TI CSD25501F3

ModelCSD25501F3
PackageLGA-3(0.6x0.7)
BrandTI
Price Price on request Electronic component prices change quickly with market supply and demand. Please refer to the latest WMSIC quotation for current pricing.
Configuration
1 options
Configuration Date code within 2 years

Available for RFQ

Technical data

Product details

19 specifications

Core information

Product name
TI(Texas Instruments) CSD25501F3
Type
TI
Minimum package
3000

Technical parameters

Electronic Component
TI(Texas Instruments)
Electronic Component
CSD25501F3
Electronic Component
1
Package
LGA-3(0.6x0.7)
Electronic Component
1 P
Type
P
Electronic Component
MOSFET
Electronic Component
0.057g
Electronic Component
1
Electronic Component
BM0228088598
Operating Temperature
55℃~+150℃
Power Dissipation(Pd)
500mW
Electronic Component
3000
Voltage(Vdss)
20V
Capacitor(Ciss)
385pF
Output Capacitor(Coss)
91pF

For datasheets, package documents, compatible-part guidance, or other technical resources, contact WMSIC customer service. Availability is confirmed case by case.

CSD25501F3 产品概述

一、概述

CSD25501F3 是德州仪器(TI)推出的一款高性能 P 沟道 MOSFET,专为便携式和空间受限的系统中的高侧开关与电源管理应用设计。该器件具有 20V 的耐压能力、较低的导通电阻以及极小的封装尺寸(LGA-3,0.6 × 0.7 mm),适合在电池供电或低压电源系统中实现高效小型化的功率开关功能。器件单个参数如下:Vdss = 20V,连续漏极电流 Id = 3.6A,RDS(on) = 120 mΩ @ VGS = 1.8V(P 沟道为负向驱动),耗散功率 Pd = 500 mW,门极电荷 Qg = 1.02 nC @ 4.5V,Ciss = 385 pF,Crss = 4.1 pF,Coss = 91 pF,工作温度范围 -55℃ 至 +150℃。

二、主要特性

  • P 沟道 MOSFET,适合做高侧开关与反接保护。
  • 20V 漏源耐压,适配常见的锂电池与 5V、12V 低压域。
  • 低导通电阻:典型 RDS(on) = 120 mΩ(在 VGS = −1.8V 条件下测得),在较小的栅压差下即可实现较低损耗。
  • Gate charge 低(Qg = 1.02 nC @ 4.5V),切换损耗小,便于快速开关与低功耗门驱动设计。
  • 小输入/输出/反向电容(Ciss = 385 pF,Coss = 91 pF,Crss = 4.1 pF),减小米勒效应与开关干扰。
  • 紧凑 LGA-3 封装(0.6 × 0.7 mm),适合空间受限设计。
  • 宽工作温度范围:-55℃ 至 +150℃,满足工业级环境需求。

三、典型应用场景

  • 电池供电设备中的高侧负载开关(便携设备、可穿戴设备、移动终端)。
  • 电源路径控制与反接保护(简单的理想二极管替代方案)。
  • 手持设备和 IoT 终端的电源管理与外设供电。
  • 低压 DC-DC 转换器中的同步开关或辅助开关(需结合系统热设计)。
  • 空间受限的消费电子产品与嵌入式模块。

四、栅极驱动与使用建议

  • P 沟道器件的导通依赖于源极电位比栅极高,通常以 VGS 的负值来表示导通状态。RDS(on) 所示 120 mΩ 在 VGS = −1.8V 条件下有效,说明在源端为系统电源电压时,只需使栅极下降约 1.8V 即可达到标称导通性能。
  • 门极驱动中可直接用 MCU 或小功率 N 沟道晶体管构成拉低电路,使栅极相对于源极形成需要的负向 VGS。
  • 由于器件 Qg 与 Ciss 较小,门极充放电快速,适合频繁开关场合,但仍需根据系统开关频率评估能耗与 EMI。
  • 阈值电压 VGS(th) 典型约 0.75V,器件在此值附近开始导通,但并非低损耗导通区,实际设计应参考 RDS(on) 指定的驱动电压等级来保证低损耗。

五、热管理与功率限制

  • 标称耗散功率 Pd = 500 mW,说明器件的封装热能力有限,长期连续高电流工作会受限于 PCB 散热能力与环境温度。
  • 在实际电路中,应通过增加铜箔面积、铺铜散热层或多点热通孔来改善散热条件,以防止过热降额。
  • 在高环境温度或连续大电流应用中,应做热仿真并按温升要求进行电流/功率降额,以保证可靠性。

六、封装与制造建议

  • LGA-3 小封装(0.6 × 0.7 mm)非常适合高密度布局,但对贴装、回流焊条件与 PCB 焊盘设计要求较高。建议按 TI 推荐的焊盘尺寸和回流曲线进行生产,避免手工焊接导致的可靠性问题。
  • 由于器件体积小、焊点敏感,推荐使用适当的焊膏量与焊盘覆铜,以及必要的防潮与静电防护措施。

七、器件选型与局限性

  • 优点:体积极小、低门极电荷、适用高侧开关;非常适合对尺寸和门驱动能耗有严格要求的应用。
  • 局限:Pd 与封装热能力限制了在高功率场合的直接应用;若需要长期传输大电流或更低的导通损耗,应考虑更大封装或多器件并联方案。
  • 选型提示:若系统电源电压较高或开关频率较高,请同时评估热设计与开关损耗,确保器件在预期工况下有足够的余量。

综上所述,CSD25501F3 为面向低压、小尺寸、高侧开关需求设计的 P 沟道 MOSFET,在便携与空间受限的设计中能够提供平衡的导通性能与快速开关特性,但需对热管理与 PCB 工艺给予充分重视,以发挥其最佳性能。

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